calculation of the scattered radiation profile in 64 slice ct scanners using experimental measurement

introduction: one of the most important parameters in x-ray ct imaging is the noise induced by detected scattered radiation. the detected scattered radiation is completely dependent on the scanner geometry as well as size, shape and material of the scanned object. the magnitude and spatial distribution of the scattered radiation in x-ray ct should be quantified for development of robust scatter correction techniques. empirical methods based on blocking the primary photons in a small region are not able to extract scatter in all elements of the detector array while the scatter profile is required for a scatter correction procedure. in this study, we measured scatter profiles in 64 slice ct scanners using a new experimental measurement. material and methods: to measure the scatter profile, a lead block array was inserted under the collimator and the phantom was exposed at the isocenter. the raw data file, which contained detector array readouts, was transferred to a pc and was read using a dedicated gui running under matlab 7.5. the scatter profile was extracted by interpolating the shadowed area. results: the scatter and spr profiles were measured. increasing the tube voltage from 80 to 140 kvp resulted in an 80% fall off in spr for a water phantom (d=210 mm) and 86% for a polypropylene phantom (d = 350 mm). increasing the air gap to 20.9 cm caused a 30% decrease in spr. conclusion: in this study, we presented a novel approach for measurement of scattered radiation distribution and spr in a ct scanner with 64-slice capability using a lead block array. the method can also be used on other multi-slice ct scanners. the proposed technique can accurately estimate scatter profiles. it is relatively straightforward, easy to use, and can be used for any related measurement.